Beam propagation under frustrated total reflectionGHATAK, A. K; SHENOY, M. R; GOYAL, I. C et al.Optics communications. 1986, Vol 56, Num 5, pp 313-317, issn 0030-4018Article

DETERMINATION DES PARAMETRES DE QUALITE D'UNE SURFACE PAR LA METHODE DE PERTURBATION D'UNE REFLEXION TOTALE INTERNELEVIN AI.1974; IZMERITEL. TEKH.; S.S.S.R.; DA. 1974; NO 4; PP. 40-42; BIBL. 6 REF.Article

ETUDES SPECTROSCOPIQUES INFRAROUGES AVEC LE DISPOSITIF DE MULTIPLES REFLEXIONS TOTALES ATTENUEES (RTA) POUR L'UR 10/UR 20.WAGNER H.1974; REV. IENA; ALLEM.; DA. 1974; VOL. 14; NO 6; PP. 349-356; BIBL. 13 REF.Article

ETUDE DE LA LINEARITE POUR LA COURBE D'ETALONNAGE ET L'INTENSITE DANS LA METHODE DE SPECTROMETRIE DE REFLEXION TOTALE ATTENUEEMATSUI T; KURODA K; TANAKA S et al.1974; JAP. ANALYST; JAP.; DA. 1974; VOL. 23; NO 9; PP. 1062-1068; ABS. ANGL.; BIBL. 6 REF.Article

Excitation of oblique surface electromagnetic waves at an anisotropically conducting artificial interface by means of the attenuated-total-reflection methodAVERKOV, Yuriy O; YAKOVENKO, Vladimir M.Journal of the Optical Society of America. B, Optical physics (Print). 2011, Vol 28, Num 1, pp 155-158, issn 0740-3224, 4 p.Article

Goos-Hänchen effect of an extraordinary refracted beamPEREZ, L. I; SIMON, M. C.Journal of modern optics (Print). 2006, Vol 53, Num 7, pp 1011-1021, issn 0950-0340, 11 p.Article

Simplified attenuated total reflection apparatusVILLAGRAN, J. C; THOMPSON, J. C.Review of scientific instruments. 1989, Vol 60, Num 6, pp 1201-1202, issn 0034-6748Article

Surface plasmon polaritons of the metamaterial four-layered structuresFENG TAO; ZHANG, Hui-Fang; YANG, Xi-Hua et al.Journal of the Optical Society of America. B, Optical physics (Print). 2009, Vol 26, Num 1, pp 50-59, issn 0740-3224, 10 p.Article

Chemical and optical properties of columbites = Propriétés chimiques et optiques de la colombiteJUNGE, W; HENTSCHKE, U; RATH, R et al.Neues Jahrbuch für Mineralogie. Abhandlungen. 1985, Vol 152, Num 2, pp 113-121, issn 0077-7757Article

Loss measurement of plasmonic modes in planar metal-insulator-metal waveguides by an attenuated total reflection methodLIN, Chien-I; GAYLORD, Thomas K.Optics letters. 2010, Vol 35, Num 22, pp 3814-3816, issn 0146-9592, 3 p.Article

Unidirectional coupler for surface plasmon polariton using total external reflection of high index materialCHO, Seong-Woo; PARK, Junghyun; LEE, Byoungho et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7420, issn 0277-786X, isbn 978-0-8194-7710-1 0-8194-7710-9, 1Vol, 74200F.1-74200F.8Conference Paper

Détection amplifiée des délais de Newton-Wigner à la réflexion totale = Amplified detection of Newton-Wigner delays to total reflectionLOAS, G; BONNET, C; CHAUVAT, D et al.Journal de physique. IV. 2006, Vol 135, pp 223-225, issn 1155-4339, 3 p.Conference Paper

Detection of explosives traces on documents by attenuated total reflection methodBOREYSHO, A. S; BERTSEVA, E. V; KOREPANOV, V. S et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 67331W.1-67331W.10, issn 0277-786X, isbn 978-0-8194-6891-8, 1VolConference Paper

Décomposition d'un faisceau due à la limitation du milieu dans le cas de réflexion totalePUN'KO, N. N; FILIPPOV, V. V.Pis′ma v žurnal èksperimental′noj i teoretičeskoj fiziki. 1984, Vol 39, Num 1, pp 18-20, issn 0370-274XArticle

Quantitative ATR-spektrokopie in einem 3-Schicht-System = Spectroscopie de réflexion totale atténuée quantitative dans un système à 3 couches = Quantitative ATR spectroscopy within a 3-layer-systemABRAHAM, K; MÜLLER, G.Optik (Stuttgart). 1985, Vol 70, Num 1, pp 29-32, issn 0030-4026Article

Facteur d'asymétrie en diffraction de rayons X dans les conditions de réflexion totale externeALEKSANDROV, P. A; AFANAS'EV, A. M; STEPANOV, S. A et al.Kristallografiâ. 1984, Vol 29, Num 2, pp 197-202, issn 0023-4761Article

DETERMINATION DU DEPLACEMENT D'UN FAISCEAU LUMINEUX PAR REFLEXION TOTALE AU MOYEN DE LA METHODE DIFFERENTIELLE OU DE PHASE STATIONNAIRE.RICARD J.1976; NOUV. REV. OPT.; FR.; DA. 1976; VOL. 7; NO 1; PP. 1-25; ABS. ANGL.; BIBL. 15 REF.Article

UNIFIED THEORY OF TOTAL REFLECTION PHENOMENA AT A DIELECTRIC INTERFACEHOROWITZ BR; TAMIR T.1973; APPL. PHYS.; GERM.; DA. 1973; VOL. 1; NO 1; PP. 31-38; BIBL. 12 REF.Serial Issue

Whispering gallery modes and other cavity modes for perfect backscattering and blazingPOPOV, E; MAYSTRE, D; TAYEB, G et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2010, Vol 27, Num 7, pp 1584-1592, issn 1084-7529, 9 p.Article

Amplification de l'effet Goos-Hänchen à la réflexion totale sur une couche diélectrique = Amplification of the Goos-Hänchen effect in the total reflection on a dielectric filmPILLON, F; GILLES, H; GIRARD, S et al.Journal de physique. IV. 2006, Vol 135, pp 257-258, issn 1155-4339, 2 p.Conference Paper

Examination of layered structures by total-reflection X-ray fluorescence analysisKNOTH, J; BORMANN, R; GUTSCHKE, R et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1993, Vol 48, Num 2, pp 285-292, issn 0584-8547Conference Paper

In situ quantitation of protein adsorption density by integrated optical waveguide attenuated total reflection spectrometrySAAVEDRA, S. S; REICHERT, W. M.Langmuir. 1991, Vol 7, Num 5, pp 995-999, issn 0743-7463Article

Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysisWEISBROD, U; GUTSCHKE, R; KNOTH, J et al.Applied physics. A, Solids and surfaces. 1991, Vol 53, Num 5, pp 449-456, issn 0721-7250Article

Accelerometer design based on attenuated total reflectionBO-SHEN ZHU; OWNER -PERTERSEN, M; LICHT, T et al.Applied optics. 1988, Vol 27, Num 14, pp 2972-2975, issn 0003-6935Article

MODELS FOR THE GOOS-HAENCHEN EFFECT.KODRE A; STRNAD J.1974; J. OPT. SOC. AMER.; U.S.A.; DA. 1974; VOL. 64; NO 12; PP. 1722-1723; BIBL. 10 REF.Article